LEICA INM300 Inspection Microscope
Highest Degree of Automation LEICA INM300 Inspection Microscope
Fully automatic inspection and measurement microscope with UV capability

Features:

  • 12”Wafer Capability
  • Superb Leica HCS optics with UV, DUV, Confocal
  • Ergonomic
  • Auto-focus in all imaging modes
  • Real-time visualization of sub micron structures down to feature sizes 0.13m
  • Dry (no immersion) 150x0.90 UV objective
  • White light confocal imaging
  • BF, DF, Interference contrast fluorescence
  • Objective Magnification 1.6x to 250x and magnification changer
  • Highest degree of automation
  • Wafer handlers available
  • Click below to view PDF Files
    Leica INM300 Semi Conductor

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